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US Patent Issued to Lockheed Martin on April 21 for "Systems and methods for wireless test modules of a wireless harness automated measurement system" (New York, Georgia, New Jersey Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,668, issued on April 21, was assigned to Lockheed Martin Corp. (Bethesda, Md.). "Systems and methods for wireless test modules of a wirele... और पढ़ें


US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Semiconductor chip and semiconductor package including the same" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,669, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor chip and semiconductor packa... और पढ़ें


US Patent Issued to CHROMA ATE on April 21 for "Method and apparatus for testing a package-on-package semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,670, issued on April 21, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan). "Method and apparatus for testing a package-on-package se... और पढ़ें


US Patent Issued to MediaTek on April 21 for "RF testing method and testing system" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,671, issued on April 21, was assigned to MediaTek Inc. (Hsinchu City, Taiwan). "RF testing method and testing system" was invented by Jung... और पढ़ें


US Patent Issued to QUALCOMM on April 21 for "Apparatus and methods for voltage droop detection in die architectures" (Arizona, California Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,672, issued on April 21, was assigned to QUALCOMM Inc. (San Diego). "Apparatus and methods for voltage droop detection in die architecture... और पढ़ें


US Patent Issued to QUALCOMM on April 21 for "Modular scan data network for high speed scan data transfer" (Indian, American Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,673, issued on April 21, was assigned to QUALCOMM Inc. (San Diego). "Modular scan data network for high speed scan data transfer" was inve... और पढ़ें


US Patent Issued to JST POWER EQUIPMENT on April 21 for "Switchgear ground and test device having ground shoe assembly with conductive clamp assembly and associated methods" (Florida Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,674, issued on April 21, was assigned to JST POWER EQUIPMENT INC. (Lake Mary, Fla.). "Switchgear ground and test device having ground shoe... और पढ़ें


US Patent Issued to ABB Schweiz on April 21 for "Circuit breaker state detector, and low-voltage electrical system including circuit breaker state detector" (Swiss, Polish Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,675, issued on April 21, was assigned to ABB Schweiz AG (Baden, Switzerland). "Circuit breaker state detector, and low-voltage electrical ... और पढ़ें


US Patent Issued to Allegro MicroSystems on April 21 for "Open-circuit sensors utilizing inductive coupling" (Argentinean Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,676, issued on April 21, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "Open-circuit sensors utilizing inductive coupling" ... और पढ़ें


US Patent Issued to LG ENERGY SOLUTION on April 21 for "Battery analysis apparatus and method" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,677, issued on April 21, was assigned to LG ENERGY SOLUTION LTD. (Seoul, South Korea). "Battery analysis apparatus and method" was invente... और पढ़ें